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Novel materials with high-dielectric(k) constants are rapidly gaining attention for their application as gate insulator for future MOS transistors. This book provides the basic principles underlying chemical vapor deposition (CVD) of hafnium oxide and hafnium silicate thin films for high-k application. In addition to the deposition fundamentals, the discussions in the book provide valuable insights to various chemical and physical characterization techniques that can be applied to thin films in ...

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  • Hafnium Oxide And Hafnium Silicate For High-k Application
  • Characterization of Hafnium Based Oxide Thin Films Deposited by CVD
  • Bhandari, Harish
  • Kartoniert, 232 S.
  • Sprache: Englisch
  • ISBN-13: 978-3-8383-3388-5
  • Titelnr.: 25287640
  • Gewicht: 314 g
  • LAP Lambert Academic Publishing (2010)
  • Herstelleradresse

    LAP Lambert Academic Publishing

    Brivibas gatve 197|1039|Riga|LV

    E-Mail: customerservice@vdm-vsg.de

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